​​​​Scanning Electron Microscopy (SEM) is a powerful tool for topological, morphological and chemical analysis of a broad range of samples. 

Few analytical instruments rival the breadth of application in the study of solid-state materials achievable through SEM. Not only can nanometre-scale resolution be achieved at high magnification, but with the correct sample preparation techniques, more specialised datasets can be acquired. These data range from determining the elemental composition of certain materials to the 3D rendering of specific structures of interest in biological tissue samples. By using these specialised techniques, a SEM user can collect accurate quantitative and qualitative data to answer specific research questions. In combination with other imaging modalities, such as fluorescence microscopy, SEM offers the perfect platform for precision analysis in both the material and biological sciences.  

The versatile application of SEM allows the Central Analytical Facilities to offer SEM services to clients from a range of different fields or industries (Figure 1). To achieve this, we are equipped with different SEM platforms that allow us to perform a broad range of analyses.

Figure 1. Overview of the main fields of application for SEM.

Our state-of-the-art equipment includes two high-resolution Field Emission SEMs (Zeiss MERLIN SEM and Thermo Fisher Apreo Volumescope), an environmental SEM (ZEISS EVO MA15 SEM), a dedicated variable pressure SEM (ZEISS LEO 1430VP) as well two light microscopes to assist in sample preparation and determining regions of interest (Carl Zeiss Axio Petrographic Light Microscope and ZEISS Stereo Light Microscope). In addition to these imaging platforms, the SEM unit is also fully equipped to offer sample preparation services such as gold and carbon sputter coating, critical point drying, chemical fixation, resin embedding and ultra-microtome sectioning.

In order to display the capabilities of each of these systems, in combination with the different sample preparation techniques, we have decided to let our work speak for itself by providing a summary of various SEM datasets related to each of the main research fields we support (Figure 1).  

Our services at a glance:​

Applications in each of the main fields mentioned in Figure 1 will be published in the next few weeks.

For SEM requests, please contact:

mrfsem@sun.ac.za​ / alicianel@sun.ac.za / jkriel@sun.ac.za

CAF Scanning Electron Microscopy facility

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